An In-Circuit Test Method for Measuring the Bonding Resistances of Individual IC Pins From an Interconnected Multiple IC Assembly of Flexible Hybrid Electronics. - Rafid Adnan Khan; Saad Yousaf; Gordon W. Roberts (IEEE Trans. Circuits Syst. II Express Briefs, 2023)

Applying Nyquist's Stability Analysis to Bode Plots With Wrapped Phase Behavior. - Saad Yousaf; Gordon W. Roberts (IEEE Trans. Circuits Syst. II Express Briefs, 2024)