Hybrid BiST Solution for Analog to Digital Converters with Low-cost Automatic Test Equipment Compatibility. - Sachin Dileep Dasnurkar; Jacob A. Abraham (ISCAS, 2009)

Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. - Sachin Dileep Dasnurkar; Jacob A. Abraham (ETS, 2010)

Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM. - Sachin Dileep Dasnurkar; Jacob A. Abraham (ISQED, 2010)

Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing. - Sachin Dileep Dasnurkar; Jacob A. Abraham (J. Electron. Test., 2012)

Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. - Animesh Datta; Mohamed H. Abu-Rahma; Sachin Dileep Dasnurkar; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; Prasanna Seeram; Prasad Bhadri; et al. (ISQED, 2013)

Experiments and analysis to characterize logic state retention limitations in 28nm process node. - Sachin Dileep Dasnurkar; Animesh Datta; Mohamed H. Abu-Rahma; Hieu Nguyen; Martin Villafana; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; et al. (VTS, 2013)