Workload-dependent BTI analysis in a processor core at high level. - Olivier Héron; Chiara Sandionigi; E. Piriou; Safa Mbarek; Vincent Huard (IRPS, 2015)

Gate oxide degradation of SiC MOSFET under short-circuit aging tests. - Safa Mbarek; François Fouquet; Pascal Dherbécourt; Mohamed Masmoudi; Olivier Latry (Microelectron. Reliab., 2016)

Short-circuit robustness test and in depth microstructural analysis study of SiC MOSFET. - Safa Mbarek; Pascal Dherbécourt; Olivier Latry; François Fouquet (Microelectron. Reliab., 2017)