Improved wafer-level spatial analysis for I_DDQ limit setting. - Sagar S. Sabade; D. M. H. Walker (ITC, 2001)

Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis. - Sagar S. Sabade; D. M. H. Walker (DFT, 2002)

Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting. - Sagar S. Sabade; D. M. H. Walker (ASP-DAC/VLSI Design, 2002)

Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. - Sagar S. Sabade; D. M. H. Walker (VTS, 2002)

IDDQ Test: Will It Survive the DSM Challenge? - Sagar S. Sabade; D. M. H. Walker (IEEE Des. Test Comput., 2002)

CROWNE: Current Ratio Outliers with Neighbor Estimator. - Sagar S. Sabade; D. M. H. Walker (DFT, 2003)

Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification. - Sagar S. Sabade; D. M. H. Walker (VLSI Design, 2003)

Use of Multiple IDDQ Test Metrics for Outlier Identification. - Sagar S. Sabade; D. M. H. Walker (VTS, 2003)

Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests. - Sagar S. Sabade; D. M. H. Walker (VLSI Design, 2004)

On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set. - Sagar S. Sabade; D. M. H. Walker (VTS, 2004)

IDDQ data analysis using neighbor current ratios. - Sagar S. Sabade; D. M. H. Walker (J. Syst. Archit., 2004)

IDDX-based test methods: A survey. - Sagar S. Sabade; D. M. H. Walker (ACM Trans. Design Autom. Electr. Syst., 2004)

IC Outlier Identification Using Multiple Test Metrics. - Sagar S. Sabade; Duncan M. Hank Walker (IEEE Des. Test Comput., 2005)

Estimation of fault-free leakage current using wafer-level spatial information. - Sagar S. Sabade; D. M. H. Walker (IEEE Trans. Very Large Scale Integr. Syst., 2006)