Inspection of Defects Depth for Stainless-Steel Sheets Using 4-coil Excitation Sensor with 1D CNN. - Saibo She; Xinnan Zheng; Kuohai Yu; Tian Meng; Yuchun Shao; Wuliang Yin (I2MTC, 2023)

Inspection of Defects Depth for Stainless-Steel Sheets Using Four-Coil Excitation Sensor and Deep Learning. - Saibo She; Xinnan Zheng; Tian Meng; Kuohai Yu; Wuliang Yin (IEEE Trans. Instrum. Meas., 2023)

Simultaneous measurements of metal thickness and defect depth using low frequency sweeping eddy current testing. - Saibo She; Zihan Xia; Xinnan Zheng; Wuliang Yin (I2MTC, 2024)

Thickness Measurement and Surface-Defect Detection for Metal Plate Using Pulsed Eddy Current Testing and Optimized Res2Net Network. - Saibo She; Xinnan Zheng; Lei Xiong; Tian Meng; Zili Zhang; Yuchun Shao; Wuliang Yin; Jialong Shen; Yunze He (IEEE Trans. Instrum. Meas., 2024)

Analytical Modeling of Eddy Current Testing for Asymmetric Cylinders and Estimation of Radii and Electromagnetic Properties. - Saibo She; Xun Zou; Kuohai Yu; Xinnan Zheng; Zhijie Zhang 001; Wuliang Yin (I2MTC, 2025)

Tilt Effects in Pulsed Eddy Current Measurements. - Kuohai Yu; Rui Guo; Saibo She; Lei Xiong; Xinnan Zheng; Xun Zou; Wuliang Yin (I2MTC, 2025)

Exploring the Effect of Probe Size and Lift-Off on Footprint in Pulsed Eddy Current Testing. - Xinnan Zheng; Kuohai Yu; Saibo She; Ruoxuan Zhu; Lei Xiong; Xun Zou; Wuliang Yin (I2MTC, 2025)

ECTAR: An Integrated Augmented Reality and Eddy Current Array System for Non-destructive Testing of Metallic Plate. - Ruoxuan Zhu; Saibo She; Tian Meng; Xinnan Zheng; Tony Peyton; Wuliang Yin (I2MTC, 2025)

Fast inversion of parameters on Jiles-Atherton hysteresis model based on physics-guided deep learning network. - Saibo She; Xiaochu Pang; Jun Liu 054; Xinnan Zheng; Kuohai Yu; Xun Zou; Ruoxuan Zhu; Rui Guo; Wuliang Yin (Eng. Appl. Artif. Intell., 2025)

Fast Real-Time Electromagnetic Tomography System for Size Prediction and Material and Position Classification. - Saibo She; Xun Zou; Xinnan Zheng; Kuohai Yu; Xiaochu Pang; Rui Guo; Jialong Shen; Yunze He; Wuliang Yin (IEEE Trans. Instrum. Meas., 2025)