Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs. - Jorge Corso; Saidapet Ramesh; Kumar Abishek; Ley Teng Tan; Chik Hooi Lew (ITC, 2021)

Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. - Saidapet Ramesh; Rahul Kalyan; Jesse Yanez; Andreas Glowatz; Maija Ryynänen; Sergej Schwarz (ITC, 2023)

Targeted Custom High-Voltage Stress Patterns on Automotive Designs. - Saidapet Ramesh; Kristofor Dickson; Akshay Jaiswal; Robert Marchese; Kiran Sunny Thota (VTS, 2023)

Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects. - Stephen Traynor; Saidapet Ramesh; Maryfe Hernandez; Lawrence Herr; Scott Chen (VTS, 2024)