Design for Autonomous Test. - Edward J. McCluskey; Saied Bozorgui-Nesbat (IEEE Trans. Computers, 1981)

Lower Overhead Design for Testability of Programmable Logic Arrays. - Saied Bozorgui-Nesbat; Edward J. McCluskey (IEEE Trans. Computers, 1986)

A fault diagnosis methodology for the UltraSPARCTM-I microprocessor. - Sridhar Narayanan; R. Srinivasan; R. P. Kunda; Marc E. Levitt; Saied Bozorgui-Nesbat (ED&TC, 1997)

A system for fast, full-text entry for small electronic devices. - Saied Bozorgui-Nesbat (ICMI, 2003)