A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance. - Takashi Sato 001; Toshiki Kanamoto; Saiko Kobayashi; Nobuhiko Goto; Takao Sato; Hitoshi Sugihara; Hiroo Masuda (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)