Layer Sensitivity Aware CNN Quantization for Resource Constrained Edge Devices. - Alptekin Vardar; Li Zhang; Susu Hu; Saiyam Bherulal Jain; Shaown Mojumder; Nellie Laleni; Ashish Shrivastava; Sourav De 002; Thomas Kämpfe (ISCMI, 2022)

The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications. - Alptekin Vardar; Li Zhang; Saiyam Bherulal Jain; Shaown Mojumder; Nellie Laleni; Sourav De 002; Thomas Kämpfe (SMACD, 2023)