Adaptive Digital Correction for Dual Quantization Sigma-Delta Modulators. - Sayfe Kiaei; Salem Abdennadher; Gabor C. Temes; Yaohua Yang (ISCAS, 1993)

Practices in Testing of Mixed-Signal and RF SoCs. - Salem Abdennadher; Saghir A. Shaikh (Asian Test Symposium, 2005)

Challenges in High Speed Interface Testing. - Salem Abdennadher; Saghir A. Shaikh (Asian Test Symposium, 2005)

Practices in Mixed-Signal and RF IC Testing. - Salem Abdennadher; Saghir A. Shaikh (IEEE Des. Test Comput., 2007)

Effects of Advances in Analog, Mixed Signal and IO Circuits on Test Strategies. - Salem Abdennadher (ATS, 2008)

Improving IO test and system evaluation via data sharing. - Anne Meixner; Salem Abdennadher (DTIS, 2012)

Practices in High-Speed IO testing. - Salem Abdennadher; Saghir A. Shaikh (ETS, 2016)

Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT. - Horaira Abu; Salem Abdennadher; Benoit Provost; Harry Muljono (ISQED, 2018)

Challenges and emerging solutions in testing HBM IO & systems. - Salem Abdennadher; Michael Altmann; Bin Xue (LATS, 2018)

Analog/Mixed Signal IP DFx from a Foundry perspective. - Salem Abdennadher; Arani Sinha; Yonghyun Kim (LATS, 2019)

At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes. - Salem Abdennadher; Kyle Tripician; Senthil Singaravelu (LATS, 2020)

High-Speed IO IP Process Technology & Design Interactions: Problems & Solutions. - Salem Abdennadher (DTTIS, 2023)