Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. - Jacob Savir; William H. McAnney; Salvatore R. Vecchio (ITC, 1985)

Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. - Jacob Savir; William H. McAnney; Salvatore R. Vecchio (ITC, 1985)

Fault Propagation Through Embedded Multiport Memories. - Jacob Savir; William H. McAnney; Salvatore R. Vecchio (IEEE Trans. Computers, 1987)

Testing for Coupled Cells in Random-Access Memories. - Jacob Savir; William H. McAnney; Salvatore R. Vecchio (IEEE Trans. Computers, 1991)