Dynamic Test Set Generation for Analog Circuits and Systems. - Sam D. Huynh; Seongwon Kim; Mani Soma; Jinyan Zhang (Asian Test Symposium, 1998)

Testability analysis and multi-frequency ATPG for analog circuits and systems. - Sam D. Huynh; Seongwon Kim; Mani Soma; Jinyan Zhang (ICCAD, 1998)

Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. - Sam D. Huynh; Jinyan Zhang; Seongwon Kim; Giri Devarayanadurg; Mani Soma (Asian Test Symposium, 1999)

A Test Point Insertion Algorithm for Mixed-Signal Circuits. - Jinyan Zhang; Sam D. Huynh; Mani Soma (VTS, 1999)

Test set selection for structural faults in analog IC's. - Giri Devarayanadurg; Mani Soma; Prashant Goteti; Sam D. Huynh (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Hierarchical ATPG for Analog Circuits and Systems. - Mani Soma; Sam D. Huynh; Jinyan Zhang; Seongwon Kim; Giri Devarayanadurg (IEEE Des. Test Comput., 2001)