Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. - Sam M.-H. Hsiao; Lowry P.-T. Wang; Aaron C.-W. Liang; Charles H.-P. Wen (ITC, 2022)

Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. - Sam M.-H. Hsiao; Amy H.-Y. Tsai; Lowry P.-T. Wang; Aaron C.-W. Liang; Charles H.-P. Wen; Herming Chiueh (ITC, 2023)