Linking Diagnostic Software to Hardware Self Test in Telecom Systems. - Harry Hulvershorn; Paul Soong; Saman Adham (ITC, 1995)

A New Hardware Fault Insertion Scheme for System Diagnostics Verification. - Benoit Nadeau-Dostie; Harry Hulvershorn; Saman Adham (ITC, 1995)

DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique. - Saman Adham; Sanjay Gupta (Asian Test Symposium, 1996)

BIST Fault Diagnosis in Scan-Based VLSI Environments. - Yuejian Wu; Saman Adham (ITC, 1996)

Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. - Dhamin Al-Khalili; Saman Adham; Côme Rozon; Moazzem Hossain; Douglas Racz (DFT, 1998)

Test Reuse at System Level. - José M. Miranda; Scott Davidson 001; Peter Dziel; Saman Adham; Steve Millman (VTS, 1998)

Design For Testability Method for CML Digital Circuits. - Bernard Antaki; Yvon Savaria; Nanhan Xiong; Saman Adham (DATE, 1999)

Linking diagnostic software to hardware self test in telecom systems. - Saman M. I. Adham; Ken Brough; Bruce Ecroyd; Stephen Foster; Paul Soong (IEEE Commun. Mag., 1999)

Scan-based BIST fault diagnosis. - Yuejian Wu; Saman Adham (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Comparing defect coverage for current-mode logic and CMOS VLSI cells. - Côme Rozon; Dhamin Al-Khalili; Saman Adham; Douglas Racz (ICECS, 2000)

Comprehensive defect analysis and testability of current-mode logic circuits. - Saman Adham; Dhamin Al-Khalili; Côme Rozon; Douglas Racz (ISCAS, 2000)

A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs. - Saman Adham; Benoit Nadeau-Dostie (MTDT, 2004)

Improved Core Isolation and Access for Hierarchical Embedded Test. - Benoit Nadeau-Dostie; Saman Adham; Russell Abbott 002 (IEEE Des. Test Comput., 2009)

Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study. - Sandeep Kumar Goel; Saman Adham; Min-Jer Wang; Ji-Jan Chen; Tze-Chiang Huang; Ashok Mehta; Frank Lee 004; Vivek Chickermane; Brion L. Keller; Thomas Valind; Subhasish Mukherjee; Navdeep Sood; et al. (ITC, 2013)

The importance of DFX, a foundry perspective. - Saman Adham; Jonathan Chang; Hung-Jen Liao; John Hung; Ting-Hua Hsieh (ITC, 2014)

Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoSTM/3D ICs. - Sandeep Kumar Goel; Min-Jer Wang; Saman Adham; Ashok Mehta; Frank Lee 004 (VLSI-DAT, 2014)

A novel DFT architecture for 3DIC test, diagnosis and repair. - Mincent Lee; Saman Adham; Min-Jer Wang; Ching-Nen Peng; Hung-Chih Lin; Sen-Kuei Hsu; Hao Chen 053 (VLSI-DAT, 2014)

A 1 Tbit/s Bandwidth 1024 b PLL/DLL-Less eDRAM PHY Using 0.3 V 0.105 mW/Gbps Low-Swing IO for CoWoS Application. - Mu-Shan Lin; Chien-Chun Tsai; Chih-Hsien Chang; Wen-Hung Huang; Ying-Yu Hsu; Shu-Chun Yang; Chin-Ming Fu; Mao-Hsuan Chou; Tien-Chien Huang; Ching-Fang Chen; Tze-Chiang Huang; Saman Adham; et al. (IEEE J. Solid State Circuits, 2014)

A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering. - Shih-Lien Lu; Cheng-En Lee; Peter Noel; Saman Adham; Ted Wong; Jonathan Chang (VLSI-DAT, 2019)

A 5-nm 254-TOPS/W 221-TOPS/mm2 Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations. - Hidehiro Fujiwara; Haruki Mori; Wei-Chang Zhao; Mei-Chen Chuang; Rawan Naous; Chao-Kai Chuang; Takeshi Hashizume; Dar Sun; Chia-Fu Lee; Kerem Akarvardar; Saman Adham; Tan-Li Chou; et al. (ISSCC, 2022)

34.4 A 3nm, 32.5TOPS/W, 55.0TOPS/mm2 and 3.78Mb/mm2 Fully-Digital Compute-in-Memory Macro Supporting INT12 × INT12 with a Parallel-MAC Architecture and Foundry 6T-SRAM Bit Cell. - Hidehiro Fujiwara; Haruki Mori; Wei-Chang Zhao; Kinshuk Khare; Cheng-En Lee; Xiaochen Peng; Vineet Joshi; Chao-Kai Chuang; Shu-Huan Hsu; Takeshi Hashizume; Toshiaki Naganuma; Chen-Hung Tien; et al. (ISSCC, 2024)

15.9 A 16nm 16Mb Embedded STT-MRAM with a 20ns Write Time, a 1012 Write Endurance and Integrated Margin-Expansion Schemes. - Ku-Feng Lin; Hiroki Noguchi; Yi-Chun Shih; Perng-Fei Yuh; Yuan-Jen Lee; Tung-Cheng Chang; Sheng-Po Huang; Yu-Fan Lin; Chun-Ying Lee; Yen-Hsiang Huang; Jui-Che Tsai; Saman Adham; et al. (ISSCC, 2024)