Comprehensive Fault Model and Testing of CMOS Circuits. - Dharma P. Agrawal; Sami A. Al-Arian (ITC, 1984)

Defining a Standard for Fault Simulator Evaluation. - Sami A. Al-Arian; Kevin A. Kwiat (ITC, 1988)

Design and Test in the Universities. - Sami A. Al-Arian (ITC, 1989)

Three approaches to design fault tolerant programmable logic arrays. - Sami A. Al-Arian; Hari P. Kunamneni (ACM Southeast Regional Conference, 1990)

Self-testing and self-reconfiguration architecture for 2-D WSI arrays. - Hussam Y. Abujbara; Sami A. Al-Arian (SPDP, 1990)

A Unique Approach to Built-in-Self-Test Circuit Design. - Sami A. Al-Arian; Hussam Y. Abujbara; Jim C. Ruel (ICCD, 1991)

Fault Simulation and Test Generation by Fault Sampling Techniques. - Sami A. Al-Arian; Musaed A. Al-Kharji (ICCD, 1992)

Degrading fault model for WSI interconnection lines. - Hussam Y. Abujbara; Sami A. Al-Arian (VTS, 1993)

A Method for Consistent Fault Coverage Reporting. - Warren H. Debany Jr.; Kevin A. Kwiat; Sami A. Al-Arian (IEEE Des. Test Comput., 1993)

Improving the Testability of VLSI Circuits through Partitioning. - Sami A. Al-Arian; Randy E. Bolling (ISCAS, 1994)

Reconfigurable Linear Feedback Register Design, Analysis & Applications. - Randy E. Bolling; Sami A. Al-Arian (ISCAS, 1994)

A novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs. - Stephan P. Athan; David L. Landis; Sami A. Al-Arian (VTS, 1996)

A New Heuristic Algorithm for Estimating Signal and Detection Probabilities. - Musaed A. Al-Kharji; Sami A. Al-Arian (Great Lakes Symposium on VLSI, 1997)

Partitioning algorithm to enhance VLSI testability. - Bassam Shaer; Sami A. Al-Arian; David L. Landis (ACM Southeast Regional Conference, 1998)

Pseudo-Exhaustive Testing of Sequential Circuits. - Bassam Shaer; Sami A. Al-Arian; David L. Landis (Great Lakes Symposium on VLSI, 1999)

Partitioning sequential circuits for pseudoexhaustive testing. - Bassam Shaer; Sami A. Al-Arian; David L. Landis (IEEE Trans. Very Large Scale Integr. Syst., 2000)

Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. - Bassam Shaer; David L. Landis; Sami A. Al-Arian (IEEE Trans. Very Large Scale Integr. Syst., 2000)