Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM. - Daniel Fainstein; Sami Rosenblatt; Alberto Cestero; Norman Robson; Toshiaki Kirihata; Subramanian S. Iyer (VLSIC, 2012)

A Self-Authenticating Chip Architecture Using an Intrinsic Fingerprint of Embedded DRAM. - Sami Rosenblatt; Srivatsan Chellappa; Alberto Cestero; Norman Robson; Toshiaki Kirihata; Subramanian S. Iyer (IEEE J. Solid State Circuits, 2013)

Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM. - Sami Rosenblatt; Daniel Fainstein; Alberto Cestero; John Safran; Norman Robson; Toshiaki Kirihata; Subramanian S. Iyer (IEEE J. Solid State Circuits, 2013)

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications. - Chandrasekharan Kothandaraman; X. Chen; Dan Moy; Dallas Lea; Sami Rosenblatt; Faraz Khan; Derek Leu; Toshiaki Kirihata; D. Ioannou; Giuseppe La Rosa; Jeffrey B. Johnson; Norman Robson; et al. (IRPS, 2015)

Evidence for the utility of quantum computing before fault tolerance. - Youngseok Kim; Andrew Eddins; Sajant Anand; Ken Xuan Wei; Ewout van den Berg; Sami Rosenblatt; Hasan Nayfeh; Yantao Wu; Michael Zaletel; Kristan Temme; Abhinav Kandala (Nat., 2023)