Field-Scale Precision: Predicting Grain Yield of Diverse Wheat Breeding Lines Using High-Throughput UAV Multispectral Imaging. - Nisar Ali; Ahmed Mohammed; Abdul Bais; Samia Berraies; Yuefeng Ruan; Richard D. Cuthbert; Jatinder S. Sangha (IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens., 2024)