Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. - Samir Boubezari; Bozena Kaminska (ISCAS, 1995)

A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. - Samir Boubezari; Bozena Kaminska (IEEE Trans. Computers, 1995)

A new reconfigurable Test Vector Generator for built-in self-test applications. - Samir Boubezari; Bozena Kaminska (J. Electron. Test., 1996)

Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. - Samir Boubezari; Eduard Cerny; Bozena Kaminska; Benoit Nadeau-Dostie (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Failure and root cause analysis for a system-on-chip: An industrial case study. - Samir Boubezari; Jayant Chhabria (IDT, 2014)