Effects of process learning and product lifecycle on risk-based quality control plans. - Belgacem Bettayeb; Samuel-Jean Bassetto (SysCon, 2014)

Using deep learning approaches to overcome limited dataset issues within semiconductor domain. - Milad Omrani Tamrin; Sébastien Henwood; Jean-François Dubois; Jean-Jules Brault; Saad Chidami; Samuel-Jean Bassetto (NEWCAS, 2019)

Measuring the dynamic engagement with a system of equations - Theory demonstration and initial analysis. - Rafael de Paula; Emile Dimas; Carl Laroche; Samuel-Jean Bassetto (SysCon, 2019)