An approach for system tests design and its application. - Samvel K. Shoukourian; Armen G. Kostanian; Valery A. Margarian; Ayman A. Ashour (VTS, 1995)

A Unified Design Methodology for Offline and Online Testing. - Samvel K. Shoukourian (IEEE Des. Test Comput., 1998)

An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases. - Samvel K. Shoukourian; A. M. Vasilyan; A. A. Avagyan; A. K. Shukurian (MIE, 1999)

An Approach for Evaluation of Redunancy Analysis Algorithms. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (MTDT, 2001)

Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. - Yervant Zorian; Samvel K. Shoukourian (IEEE Des. Test Comput., 2003)

A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (VTS, 2004)

SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IEEE Des. Test Comput., 2004)

Alternative Combination of Processes. - Levon Hayrapetyan; Samvel K. Shoukourian (PDPTA, 2006)

The equivalence problem of multidimensional multitape automata. - Haik Grigorian; Samvel K. Shoukourian (J. Comput. Syst. Sci., 2008)

An approach for formal verification of business processes. - Armen Kostanyan; Vardan Matevosyan; Samvel K. Shoukourian; Anna Varosyan (SpringSim, 2009)

The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape. - Alexander A. Letichevsky; Arsen S. Shoukourian; Samvel K. Shoukourian (LATA, 2010)

A Robust Solution for Embedded Memory Test and Repair. - K. Darbinyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (Asian Test Symposium, 2011)

Generic BIST architecture for testing of content addressable memories. - Hayk T. Grigoryan; Gurgen Harutunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IOLTS, 2011)

Symmetry Measure for Memory Test and Its Application in BIST Optimization. - Gurgen Harutunyan; Aram Hakhumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (J. Electron. Test., 2011)

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Application of defect injection flow for fault validation in memories. - K. Amirkhanyan; A. Davtyan; Gurgen Harutyunyan; T. Melkumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

Impact of process variations on read failures in SRAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. - T. Melkumyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An effective solution for building memory BIST infrastructure based on fault periodicity. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (VTS, 2013)

Extending fault periodicity table for testing faults in memories under 20nm. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2014)

A power based memory BIST grouping methodology. - L. Martirosyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2015)

An efficient approach for memory repair by reducing the number of spares. - Vrezh Sargsyan; Valery A. Vardanian; Samvel K. Shoukourian; Yervant Zorian; Avetik Yessayan (EWDTS, 2015)

Overview study on fault modeling and test methodology development for FinFET-based memories. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2015)

Securing test infrastructure of system-on-chips. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2016)

An efficient testing methodology for embedded flash memories. - Suren Martirosyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Automated flow for test pattern creation for IPs in SoC. - D. Sargsyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Experimental study on Hamming and Hsiao codes in the context of embedded applications. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. - Hayk T. Grigoryan; Samvel K. Shoukourian; Gurgen Harutyunyan; Yervant Zorian; Costas Argyrides (ITC, 2018)

Memory FIT Rate Mitigation Technique for Automotive SoCs. - Gabriele Boschi; Donato Luongo; Duccio Lazzarotti; Hanna Shaheen; Hayk T. Grigoryan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (ITC, 2019)

Armenia: Communicating to World Community in Electronic Test and Design. - Samvel K. Shoukourian; Yuri Shoukourian; Vladimir Sahakyan (ITC, 2019)

Innovative Practices on In-System Test and Reliability of Memories. - S. Bandyopadhyay; J. Mekkoth; Marc Hutner; Hayk T. Grigoryan; Arun Kumar; Samvel K. Shoukourian; Grigor Tshagharyan; Yervant Zorian; Gabriele Boschi; Duccio Lazzarotti; Donato Luongo; Hanna Shaheen; et al. (VTS, 2019)

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. - Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Polynomial algorithm for equivalence problem of deterministic multitape finite automata. - Hayk A. Grigoryan; Samvel K. Shoukourian (Theor. Comput. Sci., 2020)

Memory Physical Aware Multi-Level Fault Diagnosis Flow. - Gurgen Harutyunyan; Suren Martirosyan; Samvel K. Shoukourian; Yervant Zorian (IEEE Trans. Emerg. Top. Comput., 2020)

Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report. - Alexander Godlevsky; Hayk A. Grigoryan; Tigran Grigoryan; Samvel K. Shoukourian (Bull. EATCS, 2021)

Analytics for AI Related Applications of Multidimensional Multitape Finite Automata. - Samvel K. Shoukourian; Tigran Grigoryan; Sevak Amirkhanyan (CECNet, 2023)

An Approach for Increasing Memory Repair Efficiency. - Karen Amirkhanyan; A. Babayan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2024)

Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs. - Karen Amirkhanyan; Valery A. Vardanian; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2024)

Results of Validation Analysis for Multi-Memory Bus BIST Engines. - Armen Babayan; Samvel K. Shoukourian (EWDTS, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)