On the Testing of Multiplexers. - Samy Makar; Edward J. McCluskey (ITC, 1988)

Probability models for pseudorandom test sequences. - Edward J. McCluskey; Samy Makar; Samiha Mourad; Kenneth D. Wagner (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

The critical path for multiple faults. - Samy Makar; Edward J. McCluskey (ICCAD, 1989)

Functional Tests for Scan Chain Latches. - Samy Makar; Edward J. McCluskey (ITC, 1995)

Checking experiments to test latches. - Samy Makar; Edward J. McCluskey (VTS, 1995)

Floating Point Fault Tolerance with Backward Error Assertions. - Daniel Boley; Gene H. Golub; Samy Makar; Nirmal R. Saxena; Edward J. McCluskey (IEEE Trans. Computers, 1995)

ATPG for scan chain latches and flip-flops. - Samy Makar; Edward J. McCluskey (VTS, 1997)

A layout-based approach for ordering scan chain flip-flops. - Samy Makar (ITC, 1998)

Design for Testability and Testing of IEEE 1149.1 Tap Controller. - Subhasish Mitra; Edward J. McCluskey; Samy Makar (VTS, 2002)

Testing of Vega2, a chip multi-processor with spare processors. - Samy Makar; Tony Altinis; Niteen Patkar; Janet Wu (ITC, 2007)

CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. - Yanjing Li; Samy Makar; Subhasish Mitra (DATE, 2008)

Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study. - Yanjing Li; Eric Cheng; Samy Makar; Subhasish Mitra (ITC, 2013)