Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. - Sanae Seike; Ken Namura; Yukio Ohya; Anis Uzzaman; Shinichi Arima; Dale Meehl; Vivek Chickermane; Azumi Kobayashi; Satoshi Tanaka; Hiroyuki Adachi (ATS, 2006)