Temperature Dependence of Subthreshold Characteristics of Negative Capacitance Recessed-Source/Drain (NC R-S/D) SOI MOSFET. - Sandeep Moparthi; Pramod Kumar Tiwari; Visweswara Rao Samoju; Gopi Krishna Saramekala (iSES, 2019)

Genetic algorithm-based threshold voltage prediction of SOI JLT using multi-variable nonlinear regression. - Sandeep Moparthi; Pramod Kumar Tiwari; Gopi Krishna Saramekala (ISDCS, 2021)