A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions. - Sandeep R. Bahl; Paul Brohlin (IRPS, 2019)

A Generalized Approach to Determine the Switching Lifetime of a GaN FET. - Sandeep R. Bahl; Francisco Baltazar; Yong Xie (IRPS, 2020)

Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited). - Sandeep R. Bahl; Jungwoo Joh; Fei Yang (IRPS, 2024)