Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. - Keven Feng; Sandeep Vora; Rui Jiang; Elyse Rosenbaum; Shobha Vasudevan (DATE, 2019)

Investigation of system-level ESD-induced failures - Sandeep Vora (2020)