Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. - Riaz Naseer; Jeff Draper; Younes Boulghassoul; Sandeepan DasGupta; Art Witulski (ACM Great Lakes Symposium on VLSI, 2007)

Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. - Riaz Naseer; Younes Boulghassoul; Jeff Draper; Sandeepan DasGupta; Art Witulski (ISCAS, 2007)

1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions. - Tania Roy; Yevgeniy S. Puzyrev; En-xia Zhang; Sandeepan DasGupta; Sarah A. Francis; Daniel M. Fleetwood; Ronald D. Schrimpf; Umesh K. Mishra; Jim S. Speck; Sokrates T. Pantelides (Microelectron. Reliab., 2011)