A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28 nm node. - Xinggong Wan; Sandhya Chandrashekhar; Boris Bayha; Martin Trentzsch; Torben Balzer; Mahesh Siddabathula; Oliver Aubel (Microelectron. Reliab., 2014)

No Trouble Found (NTF) Customer Return Analysis. - Thong Tran; Sudheer Reddy Gundala; Komal Soni; Aaron Baker; Adam Fogle; Sandhya Chandrashekhar (IRPS, 2020)