In-line metrology and inspection for process control during 3D stacking of IC's. - Sandip Halder; Ingrid De Wolf; Alain Phommahaxay; Andy Miller; Mireille Maenhoudt; Gerald Beyer; Bart Swinnen; Eric Beyne (3DIC, 2011)

Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection. - Imen Chakroun; Thomas J. Ashby; Sayantan Das 003; Sandip Halder; Roel Wuyts; Wilfried Verachtert (ICPRAM, 2020)

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder (ICECS 2022, 2022)

Code Generation Using Machine Learning: A Systematic Review. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt; Wannes Meert (IEEE Access, 2022)

Deep Learning-Based Defect Classification and Detection in SEM Images. - Bappaditya Dey; Dipam Goswami; Sandip Halder; Kasem Khalil; Philippe Leray 002; Magdy A. Bayoumi (CoRR, 2022)

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. - Bappaditya Dey; Enrique Dehaerne; Kasem Khalil; Sandip Halder; Philippe Leray 002; Magdy A. Bayoumi (CoRR, 2022)

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. - Bappaditya Dey; Anh Tuan Ngo; Sara Sacchi; Víctor Blanco; Philippe Leray 002; Sandip Halder (PKDD/ECML Workshops (4), 2023)

Optimizing YOLOv7 for Semiconductor Defect Detection. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. - MinJin Hwang; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Young-han Shin (CoRR, 2023)

A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. - Vic De Ridder; Bappaditya Dey; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. - Enrique Dehaerne; Bappaditya Dey; Hossein Esfandiar; Lander Verstraete; Hyo Seon Suh; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. - Vic De Ridder; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Stefan De Gendt; Bartel Van Waeyenberge (CoRR, 2023)

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. - Thibault Lechien; Enrique Dehaerne; Bappaditya Dey; Víctor Blanco; Sandip Halder; Stefan De Gendt (CoRR, 2023)

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. - Sara Sacchi; Bappaditya Dey; Iacopo Mochi; Sandip Halder; Philippe Leray 002 (CoRR, 2023)

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. - Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. - Bappaditya Dey; Matthias Monden; Víctor Blanco; Sandip Halder; Stefan De Gendt (ECCV Workshops (4), 2024)

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. - Ying-Lin Chen; Jacob Deforce; Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002 (CoRR, 2024)

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. - Bappaditya Dey; Vic De Ridder; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2024)

An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. - Amit Prasad; Bappaditya Dey; Victor Blanco; Sandip Halder (CoRR, 2024)

Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review. - Ying-Lin Chen; Sara Sacchi; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002; Stefan De Gendt (IEEE Trans. Artif. Intell., 2024)

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series. - Bappaditya Dey; Daniel Sorensen; MinJin Hwang; Sandip Halder (CoRR, 2025)