Correctness Criteria for Models' Validation- A Philosophical Perspective. - Ijeoma Sandra Irobi; Johan Andersson; Anders Wall (MSV/AMCS, 2004)

Algorithms for Determining the Adequacy Constraints for the Validation of Models of complex Real-Time Systems. - Ijeoma Sandra Irobi; Anders Wall (MSV, 2005)

Parasitic memory effect in CMOS SRAMs. - Sandra Irobi; Zaid Al-Ars; Michel Renovell (IDT, 2010)

Detecting memory faults in the presence of bit line coupling in SRAM devices. - Sandra Irobi; Zaid Al-Ars; Said Hamdioui (ITC, 2010)

Bit line coupling memory tests for single-cell fails in SRAMs. - Sandra Irobi; Zaid Al-Ars; Said Hamdioui (VTS, 2010)

A New Test Paradigm for Semiconductor Memories in the Nano-Era. - Said Hamdioui; Venkataraman Krishnaswami; Ijeoma Sandra Irobi; Zaid Al-Ars (Asian Test Symposium, 2011)

Testing for Parasitic Memory Effect in SRAMs. - Sandra Irobi; Zaid Al-Ars; Said Hamdioui; Claude Thibeault (Asian Test Symposium, 2011)

Influence of parasitic memory effect on single-cell faults in SRAMs. - Sandra Irobi; Zaid Al-Ars; Said Hamdioui; Michel Renovell (DDECS, 2011)

Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. - Sandra Irobi; Zaid Al-Ars; Said Hamdioui (ETS, 2011)

Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices. - Ijeoma Sandra Irobi (2011)