Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. - Sandra Veljkovic; Nikola Mitrovic; Vojkan Davidovic; Snezana Golubovic; Snezana Djoric-Veljkovic; Albena Paskaleva; Dencho Spassov; Srboljub Stankovic; Marko S. Andjelkovic; Zoran Prijic; Ivica Manic; Aneta Prijic; et al. (J. Circuits Syst. Comput., 2022)

Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System. - Marko S. Andjelkovic; Junchao Chen 001; Rizwan Tariq Syed; Fabian Vargas 001; Markus Ulbricht 002; Milos Krstic; Stefan D. Ilic; Milos Marjanovic; Sandra Veljkovic; Nikola Mitrovic; Danijel Dankovic; Goran S. Ristic; et al. (DSD, 2023)