Cu-SiO2 hybrid bonding simulation including surface roughness and viscoplastic material modeling: A critical comparison of 2D and 3D modeling approach. - Thomas Wlanis; René Hammer; Werner Ecker; Sandrine Lhostis; Clément Sart; Sébastien Gallois-Garreignot; Bernhard Rebhan; Günther A. Maier (Microelectron. Reliab., 2018)

Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors. - Juan Esteban Montoya Cardona; Sylvain Joblot; Pierre Kermagoret; Grégoire Ducotey; Stéphane Hardillier; Guillaume Dupeux; Yannick Borde; Jean-Pierre Carrère; Sandrine Lhostis; Richard Monflier; Olivier Marcelot; Vincent Goiffon (IEEE SENSORS, 2024)