Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM). - Jae-Seong Jeong; Jong-Shin Ha; Sang-Deuk Park (Microelectron. Reliab., 2004)

Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System. - Jae-Seong Jeong; Jae-Hyun Lee; Jong-Shin Ha; Sang-Deuk Park (Microelectron. Reliab., 2005)

Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules. - Jae-Seong Jeong; Soon-Ha Hong; Sang-Deuk Park (Microelectron. Reliab., 2007)

Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. - Jae-Seong Jeong; Jin-Kyu Jung; Sang-Deuk Park (Microelectron. Reliab., 2008)

Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level. - Jae-Seong Jeong; Sang-Deuk Park (Microelectron. Reliab., 2009)