Removing JTAG Bottlenecks in System Interconnect Test. - Hong Shin Jun; Sung Soo Chung; Sang H. Baeg (ITC, 2004)

BPPT - Bulk potential protection technique for hardened sequentials. - Issam Nofal; Adrian Evans; Anlin He; Gang Guo; Yuanqing Li; Li Chen 001; Rui Liu 011; Haibin Wang; Mo Chen 008; Sang H. Baeg; Shi-Jie Wen; Richard Wong (IOLTS, 2017)

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. - Yuanqing Li; Li Chen 001; Issam Nofal; Mo Chen 008; Haibin Wang; Rui Liu 011; Qingyu Chen; Milos Krstic; Shuting Shi; Gang Guo; Sang H. Baeg; Shi-Jie Wen; et al. (Microelectron. Reliab., 2018)

A single event upset tolerant latch design. - Haibin Wang; Xixi Dai; Yangsheng Wang; Issam Nofal; Li Cai; Zicai Shen; Wanxiu Sun; Jinshun Bi; Bo Li 051; Gang Guo; Li Chen 001; Sang H. Baeg (Microelectron. Reliab., 2018)