Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network. - Dong-Chul Park 002; Duc-Hoai Nguyen; Sang Jeen Hong; Yunsik Lee (ICNC (1), 2005)

Sensitivity Analysis of Plasma Charge-up Monitoring Sensor. - SungJoon Lee; Dea-Wha Soh; Sang Jeen Hong (J. Inform. and Commun. Convergence Engineering, 2005)

Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE). - Sei-Young Mun; Gwang-Beom Kim; Dea-Wha Soh; Sang Jeen Hong (J. Inform. and Commun. Convergence Engineering, 2005)

Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching. - Sang Jeen Hong; Gary S. May (IEEE Trans. Ind. Electron., 2005)

Modeling and Characterization of Plasma Processes Using Modular Neural Network. - Seung Soo Han; Dong Sun Seo; Sang Jeen Hong (ISNN (2), 2006)

Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. - Byungwhan Kim; Sooyoun Kim; Sang Jeen Hong (ISNN (2), 2006)

Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells. - SungJoon Lee; A. Pandey; DongSeop Kim; Ajeet Rohatgi; Gary S. May; Sang Jeen Hong; Seung Soo Han (ISNN (3), 2007)

A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes. - Hyun-Soo Kim; Sang Jeen Hong; Seung Soo Han (FUZZ-IEEE, 2009)

Endpoint Detection of SiO2 Plasma Etching Using Expanded Hidden Markov Model. - Sung-Ik Jeon; Seung-Gyun Kim; Sang Jeen Hong; Seung Soo Han (ISNN (2), 2010)

Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network. - Javeria Muhammad Nawaz; Muhammad Zeeshan Arshad; Sang Jeen Hong (ISNN (2), 2013)

Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling. - Muhammad Zeeshan Arshad; Javeria Muhammad Nawaz; Sang Jeen Hong (J. Inf. Process. Syst., 2014)

Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. - Jeong Eun Choi; Da Hoon Seol; Chan Young Kim; Sang Jeen Hong (Sensors, 2023)

Wafer Type Ion Energy Monitoring Sensor for Plasma Diagnosis. - Chansu Han; Yoonsung Koo; Jaehwan Kim; Kwangwook Choi; Sang Jeen Hong (Sensors, 2023)