An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. - Dong-Uk Lee; Kyung Whan Kim; Kwan-Weon Kim; Kang Seol Lee; Sang Jin Byeon; Jin-Hee Cho; Han Ho Jin; Sang Kyun Nam; Jaejin Lee; Jun Hyun Chun; Sung-Joo Hong (VLSIC, 2014)

A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits. - Dong-Uk Lee; Kyung Whan Kim; Kwan-Weon Kim; Kang Seol Lee; Sang Jin Byeon; Jae-Hwan Kim; Jin-Hee Cho; Jaejin Lee; Jun Hyun Chun (IEEE J. Solid State Circuits, 2015)