An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. - Dong-Uk Lee; Kyung Whan Kim; Kwan-Weon Kim; Kang Seol Lee; Sang Jin Byeon; Jin-Hee Cho; Han Ho Jin; Sang Kyun Nam; Jaejin Lee; Jun Hyun Chun; Sung-Joo Hong (VLSIC, 2014)

High-Bandwidth Memory (HBM) Test Challenges and Solutions. - Hongshin Jun; Sang Kyun Nam; Han Ho Jin; Jong-Chern Lee; Yong Jae Park; Jaejin Lee (IEEE Des. Test, 2017)