Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. - Hyuck In Kwon; In Man Kang; Byung-Gook Park; Jong Duk Lee; Sang Sik Park; Jung Chak Ahn; Yong Hee Lee (Microelectron. Reliab., 2004)