Scalable and Reliable Overlay Multicast Network for Live Media Streaming. - Eunyong Park; Sunyoung Han; Sangjoon Ahn; Hyunje Park; Sangchul Shin (PCM (2), 2005)

End-to-End QoS Monitoring Tool Development and Performance Analysis for NGN. - Chinchol Kim; Sangchul Shin; Sang Yong Ha; Sunyoung Han; Youngjae Kim (APNOMS, 2006)

Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism. - Jongwoo Park 001; Miji Lee; Hanbyul Kang; Wooram Ko; Eunkyeong Choi; Junsik Im; Minwoo Lee; Dohwan Chung; Jinchul Park; Sangchul Shin; Sangwoo Pae (IRPS, 2015)

Optimal design of dummy ball array in wafer level package to improve board level thermal cycle reliability (BLR). - Seongwon Jeong; Jinseok Kim 005; Ayoung Kim; Byungwook Kim; Moonsoo Lee; Jaewon Chang; In Hak Baick; Hanbyul Kang; Younggeun Ji; Sangchul Shin; Sangwoo Pae (IRPS, 2018)

Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. - Younggeun Ji; Jeonghoon Kim; Jungin Kim; Miji Lee; Jaeheon Noh; Taeyoung Jeong; Juhyeon Shin; Junho Kim; Young Heo; Ung Cho; Hyun-Chul Sagong; Junekyun Park; et al. (IRPS, 2018)

A systematic study of gate dielectric TDDB in FinFET technology. - Hyunjin Kim; Minjung Jin; Hyun-Chul Sagong; Jinju Kim; Ukjin Jung; Minhyuck Choi; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2018)

Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology. - Hyun-Chul Sagong; Hyunjin Kim; Seungjin Choo; Sungyoung Yoon; Hyewon Shim; Sangsu Ha; Tae-Young Jeong; Minhyeok Choe; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2018)

Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. - Hai Jiang 005; Hyun-Chul Sagong; Jinju Kim; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2019)