A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits. - Congyin Shi; Sanghoon Lee 008; Sergio Soto Aguilar; Edgar Sánchez-Sinencio (J. Electron. Test., 2018)

A Built-In Self-Test and In Situ Analog Circuit Optimization Platform. - Sanghoon Lee 008; Congyin Shi; Jiafan Wang 002; Adriana C. Sanabria-Borbon; Hatem Osman; Jiang Hu; Edgar Sánchez-Sinencio (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

A 1-nA 4.5-nW 289-ppm/°C Current Reference Using Automatic Calibration. - Sanghoon Lee 008; Stephen K. Heinrich-Barna; Kyoohyun Noh; Keith Kunz; Edgar Sánchez-Sinencio (IEEE J. Solid State Circuits, 2020)

Current Reference Circuits: A Tutorial. - Sanghoon Lee 008; Edgar Sánchez-Sinencio (IEEE Trans. Circuits Syst. II Express Briefs, 2021)