Test-model based hierarchical DFT synthesis. - Sanjay Ramnath; Frederic Neuveux; Mokhtar Hirech; Felix Ng (ICCAD, 2002)

Power and Design for Test: A Design Automation Perspective. - Aurelia De Colle; Sanjay Ramnath; Mokhtar Hirech; Subramanian Chebiyam (J. Low Power Electron., 2005)

Fully X-tolerant combinational scan compression. - Peter Wohl; John A. Waicukauski; Sanjay Ramnath (ITC, 2007)

Minimizing the Impact of Scan Compression. - Peter Wohl; John A. Waicukauski; Rohit Kapur; Sanjay Ramnath; Emil Gizdarski; Thomas W. Williams; P. Jaini (VTS, 2007)

DFT MAX and Power. - Rohit Kapur; T. Finklea; Felix Ng; Anshuman Chandra; Sanjay Ramnath; Peter Wohl; Thomas W. Williams; Ashok Anbalan; Sandeep S. Kulkarni; Tammy Fernandes; Pramod Notiyath; Rajesh Uppuluri (J. Low Power Electron., 2007)