Statistical Multiframes Accuracy Methodology For Attendance Marking System. - Kuan Heng Lee; Sanjay V. Addicam; Ilya Krylov; Sergei Nosov; Mee Sim Lai; Zhan Qiang Lee; Chung Shien Chai (TAAI, 2019)

Statistical Multiframe Methodology with Agnostic Thresholding for Attendance Marking System. - Kuan Heng Lee; Sanjay V. Addicam; Ilya Krylov; Sergei Nosov; Mee Sim Lai; Zhan Qiang Lee; Chung Shien Chai (J. Inf. Sci. Eng., 2021)