Complete test-set generation for bridging faults in combinational-logic circuits. - Sanjoy Kumar Basu; Jogesh Chandra Paul; Pramode Ranjan Bhattacharjee (Inf. Sci., 1986)

A novel design of sequential network to facilitate fault detection. - Pramode Ranjan Bhattacharjee; Sanjoy Kumar Basu; Jogesh Chandra Paul (Proc. IEEE, 1987)

Translation of the Problem of Complete Test Set Generation to Pseudo-Boolean Programming. - Pramode Ranjan Bhattacharjee; Sanjoy Kumar Basu; Jogesh Chandra Paul (IEEE Trans. Computers, 1991)

A microcomputer-based power factor controller. - Rakendu Mandal; Sanjoy Kumar Basu; Asim Kar; Shyama Pada Chowdhury (IEEE Trans. Ind. Electron., 1994)