Moisture induced degradation of multilayer ceramic capacitors. - Daniel N. Donahoe; Michael G. Pecht; Isabel K. Lloyd; Sanka Ganesan (Microelectron. Reliab., 2006)

Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices. - Sanka Ganesan; Michael G. Pecht; Sharon Ling (Microelectron. Reliab., 2006)

Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit (MMIC) amplifiers. - Mohammadreza Keimasi; Sanka Ganesan; Michael G. Pecht (Microelectron. Reliab., 2006)

No-fault-found and intermittent failures in electronic products. - Haiyu Qi; Sanka Ganesan; Michael G. Pecht (Microelectron. Reliab., 2008)