Radiation damage characterization of digital integrated circuits. - Santiago Martin Sondón; Pablo Sergio Mandolesi; Pedro Julián; Felix Palumbo; Martin Alurralde; Alberto Filevich (LATW, 2009)

A dual core low power microcontroller with openMSP430 architecture for high reliability lockstep applications using a 180 nm high voltage technology node. - Santiago Martin Sondón; Pablo Sergio Mandolesi; Favio R. Masson; Pedro Julián; Felix Palumbo (LASCAS, 2013)

Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam. - Santiago Martin Sondón; Alfredo Falcon; Pablo Sergio Mandolesi; Pedro Julián; Nahuel Vega; Francisco Nesprias; Jorge Davidson; Felix Palumbo; Mario Debray (LATW, 2013)

BAG2-assisted analog layout synthesis for TSMC 65 nm and GPDK 45 nm. - Matthew Bio; Wolfgang Scherr; Andrew Selasi Agbemenu; Santiago Martin Sondón; Vinayak Hande; Johannes Sturm (Elektrotech. Informationstechnik, 2024)