Analysis and improvements to MATE algorithm. - Miguel Griot; Gabriel Tucci; Pablo Belzarena; Santiago Remersaro (IPCCC, 2004)

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs. - Santiago Remersaro; Xijiang Lin; Zhuo Zhang 008; Sudhakar M. Reddy; Irith Pomeranz; Janusz Rajski (ITC, 2006)

Low Shift and Capture Power Scan Tests. - Santiago Remersaro; Xijiang Lin; Sudhakar M. Reddy; Irith Pomeranz; Janusz Rajski (VLSI Design, 2007)

Scan-Based Tests with Low Switching Activity. - Santiago Remersaro; Xijiang Lin; Sudhakar M. Reddy; Irith Pomeranz; Janusz Rajski (IEEE Des. Test Comput., 2007)

ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction. - Santiago Remersaro; Janusz Rajski; Thomas Rinderknecht; Sudhakar M. Reddy; Irith Pomeranz (DFT, 2008)

A scalable method for the generation of small test sets. - Santiago Remersaro; Janusz Rajski; Sudhakar M. Reddy; Irith Pomeranz (DATE, 2009)