Predicting Scan Compression IP Configurations for Better QoR. - Jyotirmoy Saikia; Pramod Notiyath; Santosh Kulkarni 002; Ashok Anbalan; Rajesh Uppuluri; Tammy Fernandes; Parthajit Bhattacharya; Rohit Kapur (Asian Test Symposium, 2011)

Designing efficient combinational compression architecture for testing industrial circuits. - Anshuman Chandra; Santosh Kulkarni 002; Subramanian Chebiyam; Rohit Kapur (VDAT, 2015)

Deterministic Shift Power Reduction in Test Compression. - Kanad Basu; Rishi Kumar; Santosh Kulkarni 002; Rohit Kapur (VDAT, 2017)