Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. - Bappaditya Dey; Anh Tuan Ngo; Sara Sacchi; Víctor Blanco; Philippe Leray 002; Sandip Halder (PKDD/ECML Workshops (4), 2023)

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. - Sara Sacchi; Bappaditya Dey; Iacopo Mochi; Sandip Halder; Philippe Leray 002 (CoRR, 2023)

Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review. - Ying-Lin Chen; Sara Sacchi; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002; Stefan De Gendt (IEEE Trans. Artif. Intell., 2024)