Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide. - Sara Vecchi; Paolo Pavan; Francesco Maria Puglisi (ESSDERC, 2022)

The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena. - Sara Vecchi; Paolo Pavan; Francesco Maria Puglisi (IRPS, 2022)

The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging. - Lorenzo Benatti; Sara Vecchi; Milan Pesic; Francesco Maria Puglisi (IRPS, 2023)

A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs. - Sara Vecchi; Paolo Pavan; Francesco Maria Puglisi (IRPS, 2023)

Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability. - Bruno Coppolelli; Davide Cornigli; Zheyuan Chen; Andrea Padovani; Sara Vecchi; Yanliu Dang; Luc Thomas; Luca Vandelli; Jianxin Lei; Naomi Yoshida; Renu Whig; Federico Nardi; et al. (IRPS, 2025)

A Novel D2 Plasma Treatment for Defect Passivation: From Modeling to Process Optimization. - Sara Vecchi; Vikram Bhosle; Andrea Palmieri; Davide Cornigli; Fabrizio Buscemi; Andrea Padovani; Deven Raj; Andrew Cockburn; Lucien Date; Gaurav Thareja; Federico Nardi; Luca Larcher (IRPS, 2025)