Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling. - Gihun Choe; Prasanna Venkatesan Ravindran; Anni Lu; Jae Hur; Maximilian Lederer; André Reck; Sarah Lombardo; Nashrah Afroze; Josh Kacher; Asif Islam Khan; Shimeng Yu (VLSI Technology and Circuits, 2022)