Temperature Aware Adaptations for Improved Read Reliability in STT-MRAM Memory Subsystem. - Saravanan Sethuraman; Venkata Kalyan Tavva; Karthick Rajamani; Chitra K. Subramanian; Kyu-Hyoun Kim; Hillery C. Hunter; M. B. Srinivas (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Techniques to Improve Write and Retention Reliability of STT-MRAM Memory Subsystem. - Saravanan Sethuraman; Venkata Kalyan Tavva; M. B. Srinivas (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)